For inspecting semiconductor wafers or devices: — For wafers
N348508 · 2025-05-22 — The tariff classification of a metrology and inspection machine from Israel
Descriptive literature was provided for our review. The item under consideration is described as the Eagle metrology and inspection machine, which is a device designed for two-dimensional (2D) and three-dimensional (3D) Automatic Optical Inspection (AOI). The Eagle provides comprehensive coverage for semiconductor manufacturing, supporting front-side inspection at sub-micron defect levels, as well as backside and edge inspection. The 3D metrology solution delivers precise measurements for micro-bump coplanarity and height, handling up to 500 million bumps per wafer. The machine is…
N276333 · 2016-07-06 — The tariff classification of wafer loaders from Japan
The products under consideration are certain wafer loaders identified as model numbers ALMB6150, ALMB86, ALMB86180 and ALMB890. As described in your submission, these loaders, as stand alone units, are used to conduct macro inspections checking for defects and particles on the surface of semiconductor wafers. This series of loaders feature a macro arm which takes a wafer from the cassette and lifts and rotates it to allow the operator to perform a top, back and front visual inspection. Each unit also includes an integrated joystick and an optical sensor to aid in this process. You state that…
h89484 · 2002-03-25 — The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
, you requested a tariff classification ruling. The Caliper 300mm Overlay Measurement Tool (Caliper) is used in the measurement of processing errors that may occur in the manufacture of semiconductor products. The Caliper’s primary application is for monitoring layer-to-layer registration errors. Its secondary function is the measurement of critical dimensions. A computer controlled wafer handler is used to transfer wafers and load them to the wafer stage. Observation of the wafer is accomplished by an imaging system that provides a video image of the wafer. Automatic recognition is used to…
E80052 · 1999-04-05 — The tariff classification of Wafer Auto Loaders from Japan
The wafer auto loaders, manufactured by Nidek Co., Ltd., Japan, are used in semiconductor manufacturing facilities to transfer semiconductor wafers from a cassette to an optical microscope for inspection. The wafer auto loaders may also be used as a stand-alone macro inspection station. When used as a macro inspection station, the operator views the wafer using a bright light while the wafer is situated on the wafer auto loader. There are two models which are imported with microscopes, models IM-15 and IM-80. Models IM-11, IM-14, IM140CE-1, IM140DE-1, IM-80 and IM-8000 are imported without…
D89035 · 1999-03-25 — The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
The items consist of a Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A. Descriptive literature for the items was submitted with your letter for review. The manufacturer of the flatness testers is Nidek Company, Ltd. of Japan. The Nidek Flatness Tester Model FT-11, Model FT-12, Model FT-3D and Model FT-900 are non-contact flatness measuring instruments for observing the shape, patterns and density of interference fringes projected on a TV monitor…
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