For inspecting semiconductor wafers or devices: — Other
N311703 · 2020-05-18 — The tariff classification of the Cohu Ismeca NY32 from Malaysia
The item under consideration is the Cohu Ismeca NY32, which is a 32-position turret platform for integrated circuit (“IC”) testing, optical inspection and packing fully integrated into a single process. The process integration enables the equipment to perform extended autonomous operations throughout the multi-step quality procedure. The turret handler features functionality to perform extensive optical inspections but does not perform electrical testing without the connection to the customer’s external devices. The Cohu NY32 system starts operation with the input of either 30 thin JEDEC or…
g86065 · 2001-01-24 — The tariff classification of Test Handlers from Switzerland
, you requested a tariff classification ruling. The NT-116 high-speed test handler is manufactured by Ismeca (Europe) SA. The NT-116 test handler performs various functions including the following: feeding, trimming, electrical testing, visual inspection, sorting and packaging of semiconductor devices. You indicate that the NT 116 will always include either a trimming function or a bowl feed unit; in both cases, this equipment is mounted on the NT 116 test handler. Concerning the electrical testing, the handler will perform a low voltage electrical test to check the leads on the semiconductor…
962212 · 1999-08-10 — Protest 2809-98-100442; Automatic Pellicle Mounting System; Measuring or Checking Instruments, Other Optical Instruments and Appliances.
This is our decision on Protest 2809-98-100442, filed against your classification of Nikon Precision Inc.’s automatic pellicle mounting system, model AM-6 (AM-6). The entry under protest was liquidated on April 24, 1998, and this protest timely filed on July 22, 1998. FACTS: The AM-6 under protest consists of two units: a pellicle mounting unit and a particle detector for pellicles and reticles. A descriptive sheet provided with the protest explains that the pellicle mounting and particle detection units form the AM-6, which mounts pellicles onto the surface of photomasks and detect particles…
817479 · 1996-01-18 — The tariff classification of inspection systems from Belgium
The ICOS Vision Systems models LI-7050/7250, LI-3040/3050, and LI-2040/2050 are stand-alone instruments which are used for inspection of semi-conductor devices. According to the information provided to us, three types of inspection are performed by these instruments. The instruments inspect the leads of the semiconductor packages, inspect the print quality of the labels on the semiconductor packages, and inspect the plastic housing or packaging of the semiconductor for defects or damage. It is our understanding that the plastic semiconductor housing encapsulates a semiconductor chip. The…
Not sure this code fits your product? HaiLang AI determines the US HTS code from a description in about a minute.
Classify a product