Microscopes other than optical microscopes; diffraction apparatus; parts and accessories thereof:
Part of: 90 — Optical, photographic, medical or surgical instruments and apparatus
962435 · 1999-12-15 — Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
This is our decision on Protest 1001-98-102442, filed against your classification of the Measurement and Inspection SEM microscope, model MI-3080 (MI-3080) entered in 1997. The entry under protest was liquidated on July 10, 1998, and this protest was timely filed on July 15, 1998. FACTS: Protestant describes the MI-3080 as an electron beam microscope fitted with equipment specifically designed for handling and transport of semiconductor wafers. Protestant also states that the merchandise is specifically designed for the critical dimension measurement of a line, space or pitch on the surface…
951468 · 1992-04-22 — "Aladin Thermo Microscope"; Heading 9011; Heading 9012; EN 90.11; EN 90.12(A); HQ 088231
As you were advised by NY 871914, dated March 25, 1992, this matter was referred to this office for response. FACTS: The "Aladin Thermo Microscope" is designed to allow its operator to view beneath the surface of a specimen using photothermal techniques. The microscope is used to detect near- surface material cracks, discontinuities, and inhomogeneities of a material. It generates a thermal image by focusing a laser beam which heats the surface under examination and diffuses a thermal wave into the material. For example, changes in thermal material properties at a crack in a specimen cause an…
950060 · 1991-11-06 — Optical memory subsystem; scanning electron microscope;heading 8471; subheading 8471.91.00; Chapter 84, note5(A)(a); ENs 90.12 (A); Chapter 90, note 2(b); United States-Canada Free-Trade Agreement; General Note 3(c)(vii)(B).
Your letter of July 10, 1991, regarding the classification of the "Scanning Electron Microscopy Image Management System" (System) has been forwarded to this office for reply. FACTS: The article under consideration is the Optical Memory Subsystem (OMS) of the System. It is a microcomputer based image archiving system designed for scanning electron microscopes. The OMS captures, digitizes, forms a database, enhances and archives images from a scanning electron microscope. These images are indexed in a master database by batch name or reference number and then stored on removable optical disks.…
089002 · 1991-06-27 — Protest No. 2809-0-000873; laser scanning microscope;Subheading 9012.10.00; Subheading 9013.80.60; HQ 088231.
Protest for further review number 2809-0-000873 dated 5/23/90, was filed against the classification of the Model 1LM11 laser microscope system within subheading 9013.80.60, Harmonized Tariff Schedule of the United States (HTSUSA). FACTS: The article under protest is a black and white laser microscope system, also referred to as a confocal laser scanning microscope. ISSUE: Whether the subject microscope is properly classifiable within subheading 9012.10.00, HTSUSA, which provides for "[m]icroscopes other than optical microscopes . . ."; or classifiable within subheading 9013.80.60, HTSUSA,…
088231 · 1991-03-08 — Application For Further Review Of Protest No. 3801-9-002721 (October 19, 1989); Scanning Laser Microscope; Optical Microscopes; Measuring, Checking Instruments And Appliances
This protest was filed against your liquidations dated September 1, 1989, and September 8, 1989, in which certain scanning laser microscopes were classified in 9031.40.00, HTSUSA. FACTS: The merchandise consists of the WSI 1000R Scanning Laser Microscope. The microscope is essentially comprised of a laser, photodetector, data analysis unit, monitors and video camera. The product projects a laser beam onto the specimen through a series of lenses. The data resulting from the interaction between the laser and the specimen is collected by the photodetector and processed by the data analysis unit.…
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