Parts and accessories
802690 · 1994-12-22 — The tariff classification of Integrated Silicon Cantilever GMTC Micromechanical Tip from Germany
The micromechanical tip is an accessory for an atomic force microscope (AFM). The probe tip, which is composed of silicon, is scanned across a surface in a raster pattern. The atomic force microscope measures the interaction between the surface and the probe tip. The AFM is an imaging tool which allows for the imaging of very small features. The image is viewed on a monitor or is printed out on a printer. The microscope is used in research and development in the semiconductor industry. The applicable subheading for the integrated silicon cantilever GMTC micromechanical tip for an atomic force…
950060 · 1991-11-06 — Optical memory subsystem; scanning electron microscope;heading 8471; subheading 8471.91.00; Chapter 84, note5(A)(a); ENs 90.12 (A); Chapter 90, note 2(b); United States-Canada Free-Trade Agreement; General Note 3(c)(vii)(B).
Your letter of July 10, 1991, regarding the classification of the "Scanning Electron Microscopy Image Management System" (System) has been forwarded to this office for reply. FACTS: The article under consideration is the Optical Memory Subsystem (OMS) of the System. It is a microcomputer based image archiving system designed for scanning electron microscopes. The OMS captures, digitizes, forms a database, enhances and archives images from a scanning electron microscope. These images are indexed in a master database by batch name or reference number and then stored on removable optical disks.…
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