Microscopes other than optical microscopes; diffraction apparatus
N300518 · 2018-10-10 — The tariff classification of a fluorescence confocal microscope from France
, you requested a tariff classification ruling. The product at issue, identified as the Cellvizio NOVA, is described as a standalone fluorescence confocal microscope. Per the information provided, the Cellvizio NOVA utilizes a confocal laser system with fiber optic probes that allow for the imaging of the internal microstructure of tissue. The instrument consists of a wheeled platform that incorporates the requisite laser imaging system, a touchable user interface (TUI), connectors for the fiber optic probes, and other peripheral equipment, such as a thermic printer. The Cellvizio NOVA is…
N248866 · 2014-01-15 — The tariff classification of Multiprobe LT S UHV System
The Multiprobe LT S UVH System is a low-temperature scanning tunneling microscope. The instrument controls a metallic tip with a piezo motor and scanner in atomic scale to probe the sample’s surface topography and electronic structures. The model name, LT STM, refers to the low temperature which is achieved by putting the whole scanning heading inside a thermal shield, which is cooled by liquid nitrogen, while the scanning head is cooled by liquid helium. The system also includes a preparation chamber, a loadlock chamber and pumping systems. The instrument is a research laboratory instrument…
N084236 · 2009-12-08 — The tariff classification of scanning electron microscopes from Czech Republic
The tariff classification of scanning electron microscopes from Czech Republic Dear Ms. Fura: In your letter dated November 9, 2009, on behalf of FEI Company, you requested a tariff classification ruling. The two items for which you are requesting a ruling are the scanning electron microscopes (SEM), models Magellan 400 and Magellan 400L. You described the Magellan 400 as a general purpose SEM utilized by materials science and semiconductor researchers to test and analyze the true surface of nanoscale structures. The Magellan 400L you described as a SEM fitted with specially designed “load…
N042396 · 2008-10-28 — The tariff classification of JEM-1011 Transmission Electron Microscope (TEM) from Japan
The JEM-1011 Transmission Electron Microscope (TEM) is used for studying the structures of bacteria and their association with food and tissues. The primary function of the components, when used in concert in the TEM, is to help analyze the ultrastructural components of food borne bacteria. These studies will be useful in understanding the pathophysiology of food borne pathogens and will also help in our understanding of the emergence of newer pathogens. The importation will consist of the following: The JEM-1011 transmission electron microscope, the EM-17040 (EXT10) external computer kit,…
R03296 · 2006-03-10 — The tariff classification of the Nova 200 NanoLab
Descriptive literature on the FEI Company’s Nova 200 NanoLab was submitted with the ruling request. The Nova 200 NanoLab (Nova 200) is described as a dual beam Scanning Electron Microscope (SEM)/Focused Ion Beam (FIB) instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nanometers. The SEM and FIB are in a single housing with a common base. The structures that are prototyped and analyzed by Nova can be either the structures of semiconductor wafers or the structures of reticles. The Nova 200 combines ultra-high resolution field emission SEM…
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